Inspection of recombination active defects for SiGe and solar cells

Materials Research Society Symposium - Proceedings

Volumn 442, Issue , 1997, Pages 43-48

  Astafiev, O V ^a   Kalinushkin, V P ^a   Abrosimov, N V ^a  

^a PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH FROM MELT; GRAIN BOUNDARIES; LIGHT SCATTERING; SILICON SOLAR CELLS; SINGLE CRYSTALS; VISUALIZATION;

MAPPING LOW ANGLE LIGHT SCATTERING METHOD; POLYSILICON;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0030710840     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)