Particle-induced and photo-conductivities in amorphous Si:H under proton irradiation

Materials Research Society Symposium - Proceedings

Volumn 439, Issue , 1997, Pages 679-684

  Kishimoto, N ^a   Amekura, H ^a   Kono, K ^a   Saito, T ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL BONDS; ELECTRIC CONDUCTIVITY MEASUREMENT; IRRADIATION; PHOTOCONDUCTIVITY; RADIATION DAMAGE;

PARTICLE INDUCED CONDUCTIVITY (PIC);

AMORPHOUS SILICON;

EID: 0030710796     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)