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Volumn 446, Issue , 1997, Pages 299-307
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Tantalum pentoxide for advanced DRAM applications
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CAPACITORS;
CHEMICAL VAPOR DEPOSITION;
ELECTRIC BREAKDOWN;
LEAKAGE CURRENTS;
NITROGEN OXIDES;
PERMITTIVITY;
RANDOM ACCESS STORAGE;
REACTION KINETICS;
STOICHIOMETRY;
TANTALUM COMPOUNDS;
TANTALUM PENTOXIDE;
THIN FILMS;
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EID: 0030710728
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (28)
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