Reliability and alleviation of premature on-state avalanche breakdown in deep submicron power PHEMT's

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1997, Pages 261-267

  Chou, Y C ^a   Li, G P ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CURRENTS; ELECTRON BEAM LITHOGRAPHY; GATES (TRANSISTOR); MILLIMETER WAVES; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR DEVICE MANUFACTURE;

AVALANCHE BREAKDOWN; ELECTRICAL STRESSES;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0030707225     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)