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Volumn 293, Issue 1-2, 1997, Pages 40-44
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Surface photovoltaic characterizations of porous silicon layers
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Author keywords
Photovoltaic characterization; Porous silicon
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Indexed keywords
ANODIC OXIDATION;
CRYSTAL MICROSTRUCTURE;
ELECTRIC EXCITATION;
ELECTRIC PROPERTIES;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
OPTICAL PROPERTIES;
PHOTOLUMINESCENCE;
PHOTOVOLTAIC EFFECTS;
SCANNING ELECTRON MICROSCOPY;
PHOTOLUMINESCENCE SPECTROSCOPY (PL);
SURFACE PHOTOVOLTAGE SPECTROSCOPY (SPS);
POROUS SILICON;
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EID: 0030706683
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(96)08857-8 Document Type: Article |
Times cited : (18)
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References (15)
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