Influence of Pt, RuO2 and SrRuO3 intermediate layers on characteristics of (Sr0.5Ba0.5)Nb2O6 thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 1 A, 1997, Pages 284-288

  Cheng, Hsiu Fung ^a   Hu, Chen Ti ^b   Lin, I Nan ^b  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

(Sr0.5Ba0.5)Nb2O6 thin films; Pulsed laser deposition

Indexed keywords

SAWYER TOWER METHOD;

CRYSTALLINE MATERIALS; CRYSTALLIZATION; FILM GROWTH; HIGH TEMPERATURE EFFECTS; HYSTERESIS; LEAKAGE CURRENTS; MULTILAYERS; PULSED LASER APPLICATIONS; REMANENCE; SUBSTRATES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

NIOBIUM COMPOUNDS;

EID: 0030705801     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.36.284     Document Type: Article

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