Fabrication and characterization of NiFe thin film composition modulated alloys

Materials Research Society Symposium - Proceedings

Volumn 451, Issue , 1997, Pages 341-345

  Leith, S D ^a   Schwartz, D T ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL ELECTRODES; ELECTROPLATING; MICROSCOPIC EXAMINATION; NICKEL ALLOYS; OSCILLATIONS; PHASE COMPOSITION; THIN FILMS;

COMPOSITION MODULATED ALLOYS (CMAS); NICKEL IRON FILMS; POTENTIOSTATIC STRIPPING VOLTAMMETRY; SCANNING PROBE MICROSCOPY;

METALLIC FILMS;

EID: 0030704902     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)