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Volumn 73, Issue , 1997, Pages 393-396

New methods of high sensitivity, high resolution instrumentation for spectroscopic, angular and polarization measurements in the EUV, SXR and X-ray ranges

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; ELECTROMAGNETIC WAVE POLARIZATION; ION BEAMS; MIRRORS; PARTICLE BEAM DYNAMICS; PLASMA DIAGNOSTICS; POLARIMETERS; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTROSCOPY; X RAYS;

EID: 0030704830     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1088/0031-8949/1997/t73/131     Document Type: Article
Times cited : (1)

References (19)
  • 3
    • 5644267410 scopus 로고
    • Inventor certificate No. 520863, filed 15 October 1974 (USSR), USSR
    • Ananyin, O., Bykovsky, Yu., Kantsyrev, V. and Kozyrev, Yu., Inventor certificate No. 520863, filed 15 October 1974 (USSR), Bull. Izobret., USSR 11, 229 (1979).
    • (1979) Bull. Izobret. , vol.11 , pp. 229
    • Ananyin, O.1    Bykovsky, Yu.2    Kantsyrev, V.3    Kozyrev, Yu.4
  • 12
    • 0028756116 scopus 로고
    • Ulrich, J. et al., Proc. SPIE 2278, 148 (1994).
    • (1994) Proc. SPIE , vol.2278 , pp. 148
    • Ulrich, J.1
  • 18
    • 5844413513 scopus 로고    scopus 로고
    • U.S. Patent Application, Reg. No. 34,778, March 30 (1996)
    • Kantsyrev, V., Bruch, R. and Shlyaptseva, A., U.S. Patent Application, Reg. No. 34,778, March 30 (1996).
    • Kantsyrev, V.1    Bruch, R.2    Shlyaptseva, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.