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Volumn 73, Issue , 1997, Pages 393-396
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New methods of high sensitivity, high resolution instrumentation for spectroscopic, angular and polarization measurements in the EUV, SXR and X-ray ranges
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Author keywords
[No Author keywords available]
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Indexed keywords
ANGLE MEASUREMENT;
ELECTROMAGNETIC WAVE POLARIZATION;
ION BEAMS;
MIRRORS;
PARTICLE BEAM DYNAMICS;
PLASMA DIAGNOSTICS;
POLARIMETERS;
ULTRAVIOLET RADIATION;
ULTRAVIOLET SPECTROSCOPY;
X RAYS;
EXTREME ULTRAVIOLET (EUV) SPECTRAL RANGES;
GLASS CAPILLARY DEVICES;
MULTILAYER MIRRORS;
SOFT X RAY (SXR) SPECTRAL RANGES;
RADIATION DETECTORS;
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EID: 0030704830
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1088/0031-8949/1997/t73/131 Document Type: Article |
Times cited : (1)
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References (19)
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