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Volumn 452, Issue , 1997, Pages 743-748
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Substrate-surface effect on initial growth process of microcrystalline silicon films
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CRYSTALLINE MATERIALS;
EPITAXIAL GROWTH;
FILM GROWTH;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
SUBSTRATES;
SURFACES;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRATHIN FILMS;
MICROCRYSTALLINE SILICON FILMS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SILICON;
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EID: 0030704165
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (3)
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References (21)
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