Application of FEM for thick film material design

Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium

Volumn , Issue , 1997, Pages 312-316

  Nagasaka, Takashi ^a   Ootani, Yuji ^a   Oka, Kengo ^a  

^a DENSO CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; ELECTRIC RESISTANCE; FINITE ELEMENT METHOD; GLAZES; MULTILAYERS; RESISTORS; STRESS CONCENTRATION; SUBSTRATES; THERMAL EXPANSION;

RESISTANCE DRIFTS; THICK FILM RESISTORS;

THICK FILM DEVICES;

EID: 0030703508     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)