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Volumn , Issue , 1997, Pages 37-38
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Ultrafast optical eye diagram measurement using optoelectronic techniques
a a a a a a a a
a
NTT CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROOPTICAL DEVICES;
LASER BEAMS;
LASER PULSES;
LIGHT MODULATORS;
OPTICAL SYSTEMS;
OPTICAL WAVEGUIDES;
PHOTODETECTORS;
PHOTODIODES;
OPTICAL SAMPLING;
ULTRAFAST OPTICAL EYE DIAGRAM MEASUREMENT;
OPTICAL VARIABLES MEASUREMENT;
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EID: 0030703335
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (5)
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