Simultaneous measuring εr and μr of compound materials on-site using open-ended waveguide sensor

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1997, Pages 482-486

  Niu, Maode ^a   Su, Yong ^a   Yan, Jinkui ^a   Fu, Chengpeng ^a   Xu, Deming ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS TESTING; COATING TECHNIQUES; ERROR ANALYSIS; LIGHT REFLECTION; METALLIC SUPERLATTICES; OPTIMIZATION; PARAMETER ESTIMATION; SENSORS;

CONSTITUTIVE PARAMETERS; IMPROVED TECHNIQUES; OPEN ENDED WAVEGUIDES; OPTIMIZATION TECHNIQUES; REFLECTION-TRANSMISSION METHODS; SAMPLE PREPARATION; SIMULTANEOUS MEASUREMENT; THEORETICAL VALUES;

WAVEGUIDES; RECTANGULAR WAVEGUIDES;

BIOMEDIUM SENSOR; OPEN ENDED WAVEGUIDE SENSOR;

EID: 0030702182     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.1997.603996     Document Type: Conference Paper

References (9)

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