Measurement methodologies for evaluating radiation effects in photonic and MEMS technologies

Instrumentation in the Aerospace Industry : Proceedings of the International Symposium

Volumn 43, Issue , 1997, Pages 287-298

  Taylor, Edward W ^a   Paxton, Alan H ^a   Schone, Harald ^a   Sanchez, Anthony D ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; IONIZATION; MICROELECTROMECHANICAL DEVICES; PROBES; THERMAL EFFECTS;

ION MICROBEAM ANALYSIS; NUCLEAR MICROPROBES; PHOTONIC COMPONENTS;

RADIATION EFFECTS;

EID: 0030699818     PISSN: 02277576     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)