Anomalous deep center (EC-0.31 eV) in semi-insulating GaAs

Materials Research Society Symposium - Proceedings

Volumn 442, Issue , 1997, Pages 405-410

  Fang, Z Q ^a   Look, D C ^a  

^a WRIGHT STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRONS; POINT DEFECTS; QUENCHING; SPECTROSCOPY; STOICHIOMETRY;

LIGHT INTENSITY; PHOTOCURRENT; POSITRON LIFETIME SPECTROSCOPY; THERMALLY STIMULATED CURRENT SPECTROSCOPY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0030699738     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)