D.C. current-voltage characteristics and admittance spectroscopy of an Al-porous Si barrier

Materials Research Society Symposium - Proceedings

Volumn 452, Issue , 1997, Pages 619-623

  Khirouni, K ^a   Bourgoin, J C ^a   Borgi, K ^a   Maaref, H ^a   Deresmes, D ^a   Stievenard, D ^a  

^a FACULTÉ DES SCIENCES DE MONASTIR   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONS; GROWTH (MATERIALS); INTERFACES (MATERIALS); LEAD; SILICA; SPECTROSCOPY; TEMPERATURE;

ADMITTANCE SPECTROSCOPY; POOLE-FRENKEL EFFECT;

POROUS SILICON;

EID: 0030699047     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)