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Volumn , Issue , 1997, Pages 31-36
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Experimental fault analysis of 1 Mb SRAM chips
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUIT TESTING;
STATISTICAL METHODS;
VLSI CIRCUITS;
FAULT ANALYSIS;
STATIC RANDOM ACCESS MEMORY (SRAM);
RANDOM ACCESS STORAGE;
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EID: 0030697714
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (9)
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References (13)
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