On optimizing BIST-architecture by using OBDD-based approaches and genetic algorithms

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 426-431

  Oekmen, Can ^a   Keim, Martin ^a   Krieger, Rolf ^a   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS PACKAGING; GENETIC ALGORITHMS; OPTIMIZATION; RANDOM PROCESSES;

BUILT IN SELF TEST (BIST); RANDOM PATTERN TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0030697587     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)