Microstructural characterization of a 2-D woven Nicalon/SiC ceramic composite by scanning electron microscopy line-scan technique

Ceramic Engineering and Science Proceedings

Volumn 18, Issue 3 A, 1997, Pages 295-300

  Zhao, Wei ^a   Liaw, Peter K ^a   Joy, David C ^a  

^a UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); CERAMIC FIBERS; CHEMICAL ANALYSIS; FIBER REINFORCED MATERIALS; MICROSTRUCTURE; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE;

CONTINUOUS FIBER CERAMIC COMPOSITES (CFCC); ELEMENTAL LINE SCANNING CHEMICAL ANALYSIS; NICALON FIBERS;

CERAMIC MATRIX COMPOSITES;

EID: 0030692964     PISSN: 01966219     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)