Evaluation of brightness of an intense pulsed ion beam by a Thomson spectrometer

Laser and Particle Beams

Volumn 15, Issue 2, 1997, Pages 325-338

  Masugata, K ^a   Okuda, H ^a   Yatsui, K ^a   Tazima, T ^b  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE FOR FUSION SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIODES; IONIZATION OF GASES; PARTICLE SPECTROMETERS; PINCH EFFECT;

PULSED ION BEAMS (PIB); THOMSON PARABOLA SPECTROMETERS (TPS);

ION BEAMS;

EID: 0030692869     PISSN: 02630346     EISSN: None     Source Type: Journal    
DOI: 10.1017/s0263034600010624     Document Type: Review

References (10)

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3. HUMPHRIES, S. JR. 1980 Nucl. Fusion 20, 1549.
4. MASUGATA, K. et al. 1992 Proc. Int'l. Conf. on High-Power Particle Beams, Washington, DC, p. 54.
5. MASUGATA, K. et al. 1996 J. Appl. Phys. 80 (9), 4813.
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