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Volumn , Issue , 1997, Pages 7-8
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Future prospects of VCSELs: Industrial view
a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
BIT ERROR RATE;
CMOS INTEGRATED CIRCUITS;
LSI CIRCUITS;
OPTICAL INTERCONNECTS;
OXIDATION;
SEMICONDUCTING ALUMINUM COMPOUNDS;
VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);
SEMICONDUCTOR LASERS;
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EID: 0030690812
PISSN: 10994742
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (4)
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References (3)
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