Using a retro-reflecting echelle grating to improve WDM demux efficiency

LEOS Summer Topical Meeting

Volumn , Issue , 1997, Pages 82-83

  Erickson, Lynden ^a   Lamontagne, Boris ^a   He, J J ^a   Delage, Andre ^a   Davies, Mike ^a   Koteles, Emil ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAM LITHOGRAPHY; ION BEAMS; LIGHT REFLECTION; LIGHT TRANSMISSION; MASKS; PHOTOLITHOGRAPHY; POLYMETHYL METHACRYLATES; REACTIVE ION ETCHING; REFRACTIVE INDEX; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR LASERS; SURFACE ROUGHNESS;

CHEMICALLY ASSISTED ION BEAM ETCHING (CAIBE); RETRO REFLECTING ECHELLE GRATING;

FREQUENCY DIVISION MULTIPLEXING;

EID: 0030688586     PISSN: 10994742     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)