Vacancy clustering to faulted loop, stacking fault tetrahedron and void in fcc metals

Radiation Effects and Defects in Solids

Volumn 141, Issue 1-4, 1997, Pages 311-324

  Shimomura, Y ^a   Nishiguchi, R ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b Hiroshima Jogakuin University   (Japan)

Author keywords

EAM; Faulted loop; sft; Structural relaxation; Void

Indexed keywords

ALUMINUM; COMPUTER SIMULATION; GOLD; METALLOGRAPHIC MICROSTRUCTURE; MOLECULAR DYNAMICS; NICKEL;

STACKING FAULT TETRAHEDRON;

RADIATION DAMAGE;

EID: 0030688534     PISSN: 10420150     EISSN: None     Source Type: Journal    
DOI: 10.1080/10420159708211578     Document Type: Article

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