Study of circuit sensitivity to interconnect variation

International Workshop on Statistical Metrology, Proceedings, IWSM

Volumn , Issue , 1997, Pages 28-31

  Lin, Zhihao Jeff ^a   Spanos, Costas ^a   Milor, Linda ^a   Lin, Yung Tao ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; ELECTRIC RESISTANCE; SENSITIVITY ANALYSIS;

CIRCUIT SENSITIVITY; INTERCONNECT VARIATION; RING OSCILLATOR CIRCUIT;

VLSI CIRCUITS;

EID: 0030688498     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)