Morphology of p-hexaphenyl thin films

Synthetic Metals

Volumn 84, Issue 1-3, 1997, Pages 649-650

  Koch, N ^a   Resel, R ^a   Meghdadi, F ^a   Leising, G ^a   Reichmann, K ^b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Atomic force microscopy; Polycrystalline thin films; Scanning electron microscopy

Indexed keywords

AROMATIC POLYMERS; ATOMIC FORCE MICROSCOPY; CONDUCTIVE PLASTICS; CRYSTAL STRUCTURE; FILM GROWTH; NUCLEATION; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE STRUCTURE; THERMAL EFFECTS; VAPOR DEPOSITION;

PARAHEXAPHENYLS; PHYSICAL VAPOR DEPOSITION;

OLIGOMERS;

EID: 0030687241     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(96)04091-x     Document Type: Article

References (3)

1. W. Graupner, G. Grem, F. Meghdadi, Ch. Paar, G. Leising, U. Scherf, K. Müllen, W. Fischer, F. Stelzer, Mol.Cryst.Liq.Cryst., 256 (1994) 549.
2. G. Froyer, Y. Pious, E. Dall'arche, C. Chevrot, A. Sivoe, Fr.Patent No. 9008091 (1990)
3. R. Resel, F. Meghdadi, N. Koch, G. Leising, this proceedings