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Volumn 1, Issue , 1997, Pages 467-470

Study of tunneling noise using surface micromachined tunneling tip devices

Author keywords

[No Author keywords available]

Indexed keywords

ACCELEROMETERS; ELECTRODES; ELECTRON TUNNELING; ELECTROPLATING; MATHEMATICAL MODELS; MICROMACHINING; SIGNAL NOISE MEASUREMENT; SIGNAL TO NOISE RATIO; SPURIOUS SIGNAL NOISE; VACUUM;

EID: 0030686981     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (11)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.