How an 'evolving' fault model improves the behavioral test generation

Proceedings of the IEEE Great Lakes Symposium on VLSI

Volumn , Issue , 1997, Pages 124-129

  Buonanno, G ^a   Ferrandi, F ^a   Ferrandi, L ^a   Fummi, F ^a   Sciuto, D ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTATIONAL COMPLEXITY; COMPUTER HARDWARE DESCRIPTION LANGUAGES; DECISION THEORY; FAILURE ANALYSIS; GRAPH THEORY; LOGIC DESIGN;

BEHAVIORAL TEST GENERATION; DESIGN FLOW; FAULT COVERAGE; FAULT MODEL; TESTABILITY PROBLEMS;

LOGIC CIRCUITS;

EID: 0030685607     PISSN: 10661395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)