Bridges in sequential CMOS circuits: Current-voltage signature

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 68-73

  Rodriguez Montanes, R ^a   Figueras, J ^a  

^a UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CURRENT VOLTAGE CHARACTERISTICS; INTEGRATED CIRCUIT TESTING;

BRIDGING DEFECTS;

SEQUENTIAL CIRCUITS;

EID: 0030685583     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)