Contactless angle measurement using four Hall devices on single chip

International Conference on Solid-State Sensors and Actuators, Proceedings

Volumn 1, Issue , 1997, Pages 385-388

  Metz, M ^a   Haberli, A ^a   Schneider, M ^a   Steiner, R ^a   Maier, C ^a   Baltes, H ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CMOS INTEGRATED CIRCUITS; MAGNETIC FIELD MEASUREMENT; PERMANENT MAGNETS;

CONTACTLESS ANGLE DETECTION; PACKAGING MECHANICAL TOLERANCES;

HALL EFFECT TRANSDUCERS;

EID: 0030685410     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)