Scanning probe investigations of cleaved heterostructure layers

Materials Research Society Symposium - Proceedings

Volumn 451, Issue , 1997, Pages 251-256

  Ebel, J L ^a   Schlesinger, T E ^a   Reed, M L ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; ETCHING; INTERFACES (MATERIALS); OXIDATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE STRUCTURE;

ALUMINUM GALLIUM ARSENIDE; INDIUM GALLIUM ARSENIDE; INDIUM GALLIUM PHOSPHIDE;

HETEROJUNCTIONS;

EID: 0030685335     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)