GaN-based MSM UV photodetectors

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 1221-1225

  Liang, S ^a   Cai, W ^a   Li, Y ^a   Liu, Y ^a   Lu, Y ^a   Tran, C A ^a   Karlicek, R F ^a   Ferguson, I ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; PLASMA ETCHING; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR METAL BOUNDARIES; SURFACE TREATMENT;

DARK CURRENT; METAL SEMICONDUCTOR METAL (MSM) PHOTODETECTORS; NITRIDE SEMICONDUCTORS; ULTRAVIOLET PHOTODETECTORS;

ULTRAVIOLET DETECTORS;

EID: 0030685020     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)