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Volumn , Issue , 1997, Pages 34-43

Maximum safe reverse emitter voltage in bipolar transistors for reliable 10 year operation

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEGRADATION; GAIN CONTROL; RELIABILITY; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

EID: 0030683899     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (8)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.