Analysis of gate dielectrics for SiC power UMOSFETs

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1997, Pages 153-156

  Sridevan, Srikant ^a   McLarty, Peter K ^a   Baliga, B Jayant ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC FIELDS; GATES (TRANSISTOR); PERMITTIVITY; SEMICONDUCTOR DEVICE STRUCTURES; SILICA; SILICON CARBIDE;

GATE DIELECTRIC ANALYSIS;

MOSFET DEVICES;

EID: 0030683094     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)