Surface roughening and composition modulation of ZnSe-related II-VI epitaxial films

Materials Research Society Symposium - Proceedings

Volumn 448, Issue , 1997, Pages 159-164

  Tomiya, Shigetaka ^a   Tsukamoto, Hironori ^a   Itoh, Satoshi ^a   Nakano, Kazushi ^a   Morita, Etsuo ^a   Ishibashi, Akira ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; FILM GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; SUBSTRATES; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

COMPOSITION MODULATION; SURFACE RECONSTRUCTION; ZINC SELENIDE;

SEMICONDUCTING FILMS;

EID: 0030682773     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)