Phase formation and thermal stability of the compounds in the Bi2O3-PbO system

Journal of Thermal Analysis

Volumn 49, Issue 3, 1997, Pages 1197-1205

  Brǎileanu, Ana ^a   Zaharescu, Maria ^a   Crisan D ^a   Segal, E ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Romania)

^b UNIVERSITY OF BUCHAREST   (Romania)

Author keywords

DTA TG; X ray diffraction

Indexed keywords

DECOMPOSITION; DIELECTRIC PROPERTIES OF SOLIDS; DIFFERENTIAL THERMAL ANALYSIS; MELTING; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING LEAD COMPOUNDS; SOLID SOLUTIONS; STOICHIOMETRY; SYNTHESIS (CHEMICAL); THERMODYNAMIC STABILITY; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BISMUTH OXIDES; LEAD OXIDES;

BINARY MIXTURES;

EID: 0030680506     PISSN: 03684466     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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