Measurement of temperature dependence of relative permittivity by the cavity perturbation method

IEEE MTT-S International Microwave Symposium Digest

Volumn 3, Issue , 1997, Pages 1683-1686

  Takahashi, Takeshi ^a   Iijima, Yasushi ^a   Miura, Taro ^a  

^a TDK CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; MICROWAVES; PERTURBATION TECHNIQUES; TEMPERATURE MEASUREMENT;

CAVITY PERTURBATION METHOD; RELATIVE PERMITTIVITY;

PERMITTIVITY;

EID: 0030680499     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)