Soft x-ray emission studies of the electronic structure in silicon nanoclusters

Materials Research Society Symposium - Proceedings

Volumn 452, Issue , 1997, Pages 171-175

  Van Buuren, T ^a   Dinh, L N ^a   Chase, L L ^a   Siekhaus, W J ^a   Jimenez, I ^a   Terminello, L J ^a   Grush, M ^a   Callcott, T A ^a   Carlisle, J A ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTRON SPECTROSCOPY; ELECTRONIC STRUCTURE; ELECTRONS; INERT GASES; LIGHT EMISSION; PYROMETERS; SEMICONDUCTING SILICON; SPECTROMETERS; VAPORIZATION;

FLUORESCENCE SPECTROMETER; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; SOFT X RAY EMISSION SYSTEMS; THERMAL VAPORIZATION; X RAY ABSORPTION SPECTROSCOPIES;

NANOSTRUCTURED MATERIALS;

EID: 0030678342     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)