Cosmic ray-induced DC-stability failure in Si diodes

IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD)

Volumn , Issue , 1997, Pages 121-124

  Hallen, Anders ^a   Bleichner, Henry ^a   Nordgren, Kenneth ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COSMIC RAYS; ELECTRIC BREAKDOWN OF SOLIDS; FAILURE ANALYSIS; IONIZATION OF SOLIDS; PARTICLE ACCELERATORS; RADIATION EFFECTS; SEMICONDUCTING SILICON; SEMICONDUCTOR JUNCTIONS;

REVERSE BIASED PN DIODES;

AVALANCHE DIODES;

EID: 0030677888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)