Boundary scan access of built-in self-test for field programmable gate arrays

Proceedings of the Annual IEEE International ASIC Conference and Exhibit

Volumn , Issue , 1997, Pages 57-61

  Gibson, Gretchen ^a   Gray, Lisa ^a   Stroud, Charles ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN;

BOUNDARY SCAN INTERFACE; BUILT IN SELF TEST (BIST); FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

LOGIC GATES;

EID: 0030676840     PISSN: 10630988     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)