N-K-edge EXAFS study of epitaxial GaN films

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 459-464

  Katsikini, M ^a   Paloura, E C ^a   Fieber Erdmann, M ^a   Moustakas, T D ^a   Amano, H ^a   Akasaki, I ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; NITRIDES; VAPOR PHASE EPITAXY; X RAY ANALYSIS;

EXTENDED X RAY ABSORPTION FINE STRUCTURE; GALLIUM NITRIDE;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0030676649     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)