Soft X-ray Si 2p core-level spectra of H8Si8O12 physisorbed on Si(111)-H: Additional experimental evidence regarding the binding energy shift of the HSiO3 fragment

Materials Research Society Symposium - Proceedings

Volumn 446, Issue , 1997, Pages 241-246

  Zhang, K Z ^a   Holl, Mark M Banaszak ^a   McFeely, F R ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ELECTRON ENERGY LEVELS; EMISSION SPECTROSCOPY; PHOTOEMISSION; SEMICONDUCTING SILICON; SORPTION; X RAY SPECTROSCOPY;

HYDRIDOSPHEROSILOXANE;

SILANES;

EID: 0030676608     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)