Non-redundancy based approach to validate a measuring device

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 1, Issue , 1997, Pages 540-543

  Ma, J ^a   Amadi Echendu, J E ^a   Yan, Y ^a  

^a UNIVERSITY OF GREENWICH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

REDUNDANCY; ALGORITHMS; COMPUTER HARDWARE; NEURAL NETWORKS; PARAMETER ESTIMATION; PROCESS CONTROL; SIGNAL PROCESSING; VECTORS;

FUNCTIONAL REDUNDANCY; MEASUREMENT DEVICE; MEASURING DEVICE; PHYSICAL INTERFACE; PROCESS STATE; SIGNAL PROCESSING ALGORITHMS; TOTAL RESPONSE; WIDEBAND SIGNALS;

SIGNAL PROCESSING; SENSORS;

REDUNDANCY BASED VALIDATION SYSTEMS;

EID: 0030676380     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.1997.604007     Document Type: Conference Paper

References (8)

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