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Volumn 49, Issue 2, 1997, Pages 1025-1037

Temperature resolved X-ray diffraction as a tool of thermal analysis

Author keywords

Crystallographic evaluation; Evaluation with difference procedure; Kinetics; Rietveld refinement; Temperature resolved; X ray diffraction

Indexed keywords

AMMONIUM COMPOUNDS; COPPER OXIDES; CORROSION; CURVE FITTING; NICKEL; PHASE TRANSITIONS; REACTION KINETICS; THERMOANALYSIS;

EID: 0030674880     PISSN: 03684466     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01996790     Document Type: Article
Times cited : (4)

References (28)
  • 19
    • 33751298022 scopus 로고    scopus 로고
    • V. Kolarik, Diplomarbeit 1989, Fraunhoferinstitut f. Chem. Techn., D76327 Berghausen
    • V. Kolarik, Diplomarbeit 1989, Fraunhoferinstitut f. Chem. Techn., D76327 Berghausen.
  • 24
    • 33751305131 scopus 로고
    • Thesis Fraunhoferinstitut f. Chem. Techn., D76327 Berghausen
    • V. Kolarik, Thesis 1993, Fraunhoferinstitut f. Chem. Techn., D76327 Berghausen.
    • (1993)
    • Kolarik, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.