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Volumn 49, Issue 2, 1997, Pages 1025-1037
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Temperature resolved X-ray diffraction as a tool of thermal analysis
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Author keywords
Crystallographic evaluation; Evaluation with difference procedure; Kinetics; Rietveld refinement; Temperature resolved; X ray diffraction
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Indexed keywords
AMMONIUM COMPOUNDS;
COPPER OXIDES;
CORROSION;
CURVE FITTING;
NICKEL;
PHASE TRANSITIONS;
REACTION KINETICS;
THERMOANALYSIS;
AMMONIUM NITRATE;
RIETVELD REFINEMENT;
TEMPERATURE RESOLVED X RAY DIFFRACTION ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
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EID: 0030674880
PISSN: 03684466
EISSN: None
Source Type: Journal
DOI: 10.1007/bf01996790 Document Type: Article |
Times cited : (4)
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References (28)
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