Rapid degradation of InGaAsP/InP laser diodes due to copper contamination

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1997, Pages 268-271

  Fujihara, Kiyoshi ^a   Ishino, Masato ^a   Matsui, Yasushi ^a  

^a PANASONIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CONTAMINATION; COPPER; DEGRADATION; DISLOCATIONS (CRYSTALS); HETEROJUNCTIONS; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR QUANTUM WELLS;

COPPER CONTAMINATION;

SEMICONDUCTOR LASERS;

EID: 0030674851     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)