Electron speckle and higher-order correlation functions from amorphous thin films

Materials Research Society Symposium - Proceedings

Volumn 455, Issue , 1997, Pages 349-356

  Gibson, Murray J ^a   Treacy, M M J ^a   Loretto, D ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ANNEALING; CORRELATION METHODS; ELECTRONS; FUNCTIONS; MOLECULAR STRUCTURE; STATISTICAL METHODS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON SPECKLE; HIGHER ORDER CORRELATION FUNCTIONS; MEDIUM RANGE ORDER; VARIABLE COHERENCE MICROSCOPY;

SEMICONDUCTING FILMS;

EID: 0030674593     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)