Synthesis and characterization of nanosized titanium oxide films on the (0001) α-Al2O3 surface

Thin Solid Films

Volumn 293, Issue 1-2, 1997, Pages 91-95

  Dolgushev, N V ^a   Malkov, A A ^a   Malygin, A A ^a   Suvorov, S A ^a   Shchukarev, A V ^b   Beljaev, A V ^c   Bykov, V A ^c  

^a ST PETERSBURG STATE INSTITUTE OF TECHNOLOGY TECHNICAL UNIVERSITY   (Russian Federation)

^b Mekhanobr Analyt Co   (Russian Federation)

^c Zelenograd Research Institute of Physical Problems   (Russian Federation)

Author keywords

Atomic force microscopy; Growth mechanism; Titanium dioxide

Indexed keywords

ALUMINA; ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; FILM GROWTH; MORPHOLOGY; NANOSTRUCTURED MATERIALS; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY;

TITANIUM OXIDES;

EID: 0030674117     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08985-7     Document Type: Article

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