Bias dependent HEMT noise model

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 1997, Pages 881-884

  Klapproth, Lars ^a   Schaefer, Andre ^a   Boeck, Georg ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; ELECTRIC FIELD EFFECTS; EQUIVALENT CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SPURIOUS SIGNAL NOISE;

CORRELATION MATRIX TECHNIQUE; NOISE PARAMETER MEASUREMENTS;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0030673454     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)