Photocarrier recombination in microcrystalline silicon studied by light induced electron spin resonance transients

Materials Research Society Symposium - Proceedings

Volumn 452, Issue , 1997, Pages 827-832

  Mueller, J ^a   Finger, F ^a   Malten, C ^a   Wagner, H ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTALLINE MATERIALS; ELECTRONIC DENSITY OF STATES; ELECTRONS; HYDROGEN; PARAMAGNETIC RESONANCE; SEMICONDUCTOR DOPING; SILANES;

CONDUCTION ELECTRON; DANGLING BOND; MICROCRYSTALLINE SILICON; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

SEMICONDUCTING SILICON;

EID: 0030673037     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)