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Volumn 12, Issue 1, 1997, Pages 19-21
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Semiconductor characterization by a new contactless electroreflectance technique employing surface acoustic waves
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC WAVES;
AMPLITUDE MODULATION;
ELECTRIC CHARGE;
ELECTRIC FIELDS;
LIGHT MODULATION;
LIGHT REFLECTION;
MOLECULAR BEAM EPITAXY;
PHOTODIODES;
PIEZOELECTRIC MATERIALS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTOR QUANTUM WELLS;
SUBSTRATES;
ACOUSTOELECTRIC FIELDS;
CHARGE TRAPPING;
CONTACTLESS ELECTROREFLECTANCE TECHNIQUE;
OPTICAL REFLECTIVITY;
SURFACE ACOUSTIC WAVES;
SEMICONDUCTOR MATERIALS;
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EID: 0030672250
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/12/1/004 Document Type: Article |
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Times cited : (6)
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References (9)
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