Long-term (>30,000-40,000 h) creep behavior of an advanced Si3N4 ceramic

Key Engineering Materials

Volumn , Issue 136 PART I, 1997, Pages 583-586

  Liu, K C ^a   Lin, H T ^a   Stevens, C O ^a   Brinkman, C R ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Creep; Creep behavior; Creep cavitation; Silicon nitride

Indexed keywords

CERAMIC MATERIALS; CREEP TESTING; GRAIN BOUNDARIES; HOT ISOSTATIC PRESSING; STRAIN MEASUREMENT;

CREEP CAVITATION;

SILICON NITRIDE;

EID: 0030671830     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Article

References (5)

1. [1} R. H. Yeckley and K. N. Siebein, Ceram. Mat. & Comp. for Eng., Am. Ceram. Soc. (1989), p. 751.
2. M. N. Menon et al., J. Am. Ceram. Soc., 77 (1994), p. 1217.
3. K. C. Liu and C. R. Brinkman, Proc. 23rd ATD/CCM, P-165 (1986), p. 279.
4. H. Pih and K. C. Liu, Experimental Mechanics, 31 [1] (1991), p. 60.
5. W. E. Luecke et al., J. Am. Ceram. Soc., 78 [8] (1995), p. 2085.