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Volumn 61, Issue 3, 1997, Pages 453-461

Digital analysis of X-ray films

Author keywords

Computers in crystallography; Digital analysis; Powder technique; X ray diffraction; X ray films

Indexed keywords

DIGITAL ANALYSIS; IMAGE ANALYSIS; X-RAY FILM; XRD;

EID: 0030670897     PISSN: 0026461X     EISSN: None     Source Type: Journal    
DOI: 10.1180/minmag.1997.061.406.11     Document Type: Article
Times cited : (3)

References (3)
  • 1
    • 0027877176 scopus 로고
    • Rapid computer analysis of X-ray diffraction films
    • O'Neill, B., Ngugen, J.H. and Jeanloz, R. (1993) Rapid computer analysis of X-ray diffraction films. Amer. Mineral., 78, 1332-5.
    • (1993) Amer. Mineral. , vol.78 , pp. 1332-1335
    • O'Neill, B.1    Ngugen, J.H.2    Jeanloz, R.3
  • 3
    • 0001201206 scopus 로고
    • Phase transitions in leucite: Dielectric properties and transition mechanism
    • Palmer, D.C. and Salje, E.K.H. (1990) Phase transitions in leucite: dielectric properties and transition mechanism. Phys. Chem. of Minerals, 17, 444-52.
    • (1990) Phys. Chem. of Minerals , vol.17 , pp. 444-452
    • Palmer, D.C.1    Salje, E.K.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.